| Brand Name: | Hoan |
| Model Number: | HNM221S30V500 |
| MOQ: | 10 Pieces |
| Payment Terms: | T/T,L/C,D/A,D/P |
Summary: The HNM221S30V500 is a single-layer MOS (metal-oxide-semiconductor) chip capacitor rated 220 pF / 30 V DC, built on float-zone silicon with a thermal SiO&sub2; dielectric and an all-gold (TiW-Au) electrode system. It is non-ferromagnetic, temperature-stable, and offers intrinsic inductance below 0.05 nH, making it a single-layer MOS capacitor option for broadband RF bypassing and decoupling where magnetic interference, drift, and ESL matter. Capacitance value, chip geometry and metallization are customizable.
| Parameter | Value | Test Condition |
| Capacitance | 220 pF ±10% | 1 MHz, 1.0 Vrms |
| Tolerance options | ±10% (K), ±5% (J) | — |
| Rated DC voltage | 30 V | Continuous |
| Dielectric strength | >100 V DC | 1 min, 25 °C |
| Intrinsic chip ESL | <0.05 nH | De-embedded from S-parameters |
| Q factor @ 1 MHz / 1 GHz | >2000 / >200 | Typical |
| ESR @ 1 GHz | <0.1 Ω | Typical |
| TCC | +35 ppm/°C | −55 °C to +125 °C |
| DC bias coefficient | <10 ppm/V | 0 V to rated |
| Leakage current | <10 nA | 30 V DC, 25 °C |
| Dielectric / substrate | Thermal SiO&sub2; 300 nm / float-zone Si >1000 Ω·cm | — |
| Operating / storage | −55 to +125 °C / −65 to +150 °C | — |
| RoHS | Compliant | EU 2015/863 |
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