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Self-Heating Thermal Smoothing MOS Capacitor HACC222S50V1000 2200 pF 50V Single Layer Chip for RF Power Amplifiers

Self-Heating Thermal Smoothing MOS Capacitor HACC222S50V1000 2200 pF 50V Single Layer Chip for RF Power Amplifiers

Brand Name: Hoan
Model Number: HACC222S50V1000
MOQ: 10 Pieces
Payment Terms: L/C,D/A,D/P,T/T
Detail Information
Place of Origin:
Shaanxi, China
Certification:
ISO 9001:2015, RoHS
Chip Dimensions:
1.00 × 1.00 × 0.15 Mm
Top Metallization:
TiW (100nm) + Au (4.0µm Min)
Backside Metallization:
TiW-Pt-Au, Au 2.0µm Min
Mounting Type:
Eutectic Die Attach / Wire Bondable
Operating Temperature:
-55°C To +125°C
Customization:
Custom Capacitance, Die Geometry, Metallization, And Packing
Highlight:

Self-Heating MOS Capacitor 2200 pF

,

Thermal Smoothing Capacitor 50V

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Single Layer Chip Capacitor RF Power Amplifiers

Product Description

Self-Heating Thermal Redistribution MOS Capacitor — HACC222S50V1000


Definition: The HACC222S50V1000 is a 2200 pF ±10%, 50 V DC, single-layer MOS capacitor on a float-zone silicon substrate with a 300 nm thermal SiO2 dielectric. A 1.00 × 1.00 × 0.15 mm chip, an ultra-thick 4.0 µm gold top electrode, and a fully metallized TiW-Pt-Au backside create a low-thermal-resistance path that redistributes and smooths self-generated heat in RF power amplifier modules.



Quick answer — at a glance


  • What it is: single-layer MOS capacitor, 2200 pF, 50 V, wire-bondable bare die.
  • Core function: self-heating thermal redistribution and thermal smoothing in high-power RF amplifiers.
  • Why it works: 300 nm SiO2 sandwiched between two high-conductivity gold electrodes gives a low thermal-resistance path.
  • Thermal performance: junction-to-case thermal resistance <8 K/W; self-heating rise <5 °C at 40 W RF dissipation.
  • Stability: +35 ppm/°C from −55 °C to +125 °C; stable C–V across the thermal cycle.
  • Chip: 1.00 × 1.00 × 0.15 mm; intrinsic ESL <0.05 nH; Q >300 at 1 GHz.


Key features


  • Low thermal resistance: <8 K/W junction-to-case via fully metallized backside and thick gold electrode.
  • Thermal smoothing: <5 °C self-heating rise at 40 W RF dissipation; stable C–V over temperature.
  • High capacitance density: 2200 pF on a 1.00 mm chip for compact output matching and bias decoupling.
  • Intrinsic chip ESL <0.05 nH; Q >300 at 1 GHz.
  • TiW-Au top (≥4.0 µm) and TiW-Pt-Au backside for AuSn eutectic die attach.
  • RoHS compliant (EU 2015/863); ESD Class 0 (HBM) handling per JESD22-A114.


Specifications (T = 25 °C unless noted)


Parameter Value Test condition
Capacitance 2200 pF ±10% (±5% option) 1 MHz, 1.0 Vrms
Rated DC voltage 50 V Continuous operation
Dielectric withstanding voltage >125 V DC 1 minute ramp, 25 °C
Dielectric Thermal SiO2, 300 nm Dry oxidation
Substrate Float-zone Si, >1000 Ω·cm —
Thermal resistance (junction-to-case) <8 K/W AuSn die attach
Self-heating temperature rise <5 °C 40 W RF dissipation
Intrinsic chip ESL <0.05 nH De-embedded from S-parameter
Q factor @ 1 GHz >300 Typical
TCC +35 ppm/°C −55 °C to +125 °C
Operating / storage temperature −55 °C to +125 °C / −65 °C to +150 °C —
Chip dimensions 1.00 × 1.00 × 0.15 mm ±0.025 mm


Typical applications


  • RF power amplifier output matching and drain-bias feeds.
  • DC blocking and bypass in high-power RF signal chains.
  • Cellular base station and remote radio unit (RRU) power stages.
  • Industrial RF heating, plasma excitation, and power supplies.
  • Wireless power and energy-harvesting circuits with high circulating current.
  • Test & measurement fixtures operating at sustained RF power.


Self-Heating Thermal Smoothing MOS Capacitor HACC222S50V1000 2200 pF 50V Single Layer Chip for RF Power Amplifiers