| Brand Name: | Hoan |
| Model Number: | HACC-CUSTOM-DV |
| MOQ: | 10 Pieces |
| Payment Terms: | L/C,D/A,D/P,T/T,Western Union |
The HACC-CUSTOM-DV extends the single-layer MOS capacitor voltage range through engineered dielectric thickness. The standard thermally grown SiO₂ dielectric (50–5000Å) supports rated voltages up to 500V. For higher voltage requirements, a stacked dielectric architecture — combining SiO₂ with stress-controlled SiN or high-k Al₂O₃ layers — achieves rated voltages up to 1000V while maintaining capacitance density. Dielectric withstanding voltage (DWV) is verified at 250–300% of rated voltage on every wafer, and time-dependent dielectric breakdown (TDDB) lifetime exceeds 10 years at maximum rated temperature. Thickness tolerance is ±2% wafer-level and ±1% within-die, verified by spectroscopic ellipsometry on every wafer.
The air-free single-layer MOS architecture eliminates the delamination and partial discharge risks associated with multi-layer ceramic capacitors (MLCCs) at high voltage gradients. Unlike MLCCs where internal electrode edges concentrate electric fields, the MOS capacitor's planar metal-insulator-semiconductor structure provides uniform field distribution across the entire capacitor area — a critical advantage for high-voltage reliability.
The HACC-CUSTOM-DV accommodates any downstream assembly flow with three delivery options, individually selectable per production lot or mixed per wafer split:
Mixed packaging — for example, 50% of a wafer as Gel-Pak and 50% as waffle pack — is supported without requalification, providing maximum flexibility for prototype-to-production transitions or multi-site assembly flows.
As with all HACC-CUSTOM products, substrate doping is a design parameter: N+ or P+ profiles with resistivity from 0.001 to 1000 Ohm·cm, optimized for the target breakdown voltage (BVdss) and series resistance trade-off. The C-V characteristic can be shaped for flat capacitance or controlled-slope varactor behavior.
| Parameter | Value |
|---|---|
| Capacitance | 5pF–10,000pF |
| Dielectric Thickness | 50–5000Å, SiO₂/SiN/Al₂O₃ |
| Voltage Rating | Up to 500V (single-layer), 1000V (stacked) |
| Dielectric Strength | 250–300% of rated, TDDB >10 years |
| Substrate Resistivity | 0.001–1000 Ω·cm, N+/P+ tailored |
| TCC | <30 ppm/°C |
| ESR | <0.1 Ω at 1 GHz |
| Top Metallization | TiW-Au, Al-metallized, AuSn pre-deposition |
| Delivery Options | Wafer-level, Gel-Pak, waffle pack |
| Operating Temperature | -55°C to +125°C |
Contact us with your voltage requirement, dielectric specifications, and delivery format preference. Extreme-voltage MOS capacitor prototypes ship in 5–7 business days.