| Brand Name: | Hoan |
| Model Number: | HACC102S35V500 |
| MOQ: | 10Pieces |
| Payment Terms: | L/C,D/A,D/P,T/T,Western Union |
The HACC102S35V500 is purpose-built for RF design engineers who cannot afford insertion loss. Every parameter — from the 2.5μm gold top metal to the thermally-grown SiO2 dielectric — has been optimized for one goal: maximum Q factor with minimum ESR in a die that drops directly into your existing foundry flow.
Unlike discrete SMD capacitors that introduce 200-500pH of parasitic inductance at the board level, the HACC102S35V500 integrates at the die or module level, reducing interconnect parasitics by an order of magnitude. For a 5G n77 power amplifier output match, that difference can mean 2-3 percentage points of PAE.
In an RF matching network, the loaded Q of the inductor typically limits bandwidth. But capacitor Q determines insertion loss. At 3.5GHz — the heart of 5G sub-6GHz — the HACC102S35V500 maintains a Q exceeding 100. In a two-element L-match with a Q=40 inductor, switching from a Q=50 capacitor (typical MLCC) to a Q=100+ capacitor (HACC102S35V500) recovers approximately 0.4dB of through-loss. In a 4-stage Doherty PA with 8 matching elements, the cumulative improvement exceeds 2dB — the difference between meeting and missing 3GPP ACLR masks.
The HACC102S35V500 is manufactured on a standard high-resistivity silicon substrate (>1000 Ω·cm) using only materials and processes available in every major CMOS and BiCMOS fab:
No exotic materials. No specialized equipment. No process qualification hurdle. The HACC series Process Design Kit (PDK) includes DRC rules, layer mapping, and verified device models calibrated to 40GHz — ready for direct import into Cadence Virtuoso, Keysight ADS, or ANSYS HFSS.
| Metric | HACC102S35V500 | 0402 MLCC (X7R) | Thin-Film Si Cap |
|---|---|---|---|
| Capacitance | 1000pF | 1000pF | 1000pF |
| Q @ 1GHz | >100 | ~15-25 | ~50-80 |
| ESR @ 1GHz | <0.5Ω | ~3-8Ω | ~1-2Ω |
| ESL | <50pH | ~300-500pH | ~50-80pH |
| SRF | >20GHz | ~200-500MHz | ~5-10GHz |
| VCC | <50ppm/V | −25% to −80% | <50ppm/V |
| TCC | <30ppm/°C | ±15% | <30ppm/°C |
| Piezoelectric Noise | None | Significant | None |
| Integration Level | Die/module | Board-level SMD | Die/module |
Modern 5G handsets pack up to 12 PA cores across n77/n78/n79 bands. Output matching networks operate at 3.3-5.0GHz where every milliohm of ESR directly subtracts from radiated power. The HACC102S35V500's sub-0.3Ω ESR at 1MHz (sub-0.5Ω at 1GHz) minimizes matching network loss, while the 35V rating accommodates the >10V peak voltages seen in envelope-tracking PA supply modulators.
SATCOM and radar phased arrays require channel-to-channel gain and phase matching across hundreds of elements. With wafer-level σ<2% capacitance uniformity, the HACC102S35V500 ensures consistent impedance transformation across every beamformer channel, minimizing the calibration burden in digital beamforming architectures.
E-band (71-86GHz) backhaul links demand capacitors with self-resonance well above the operating band. The HACC102S35V500's <50pH ESL pushes SRF beyond 20GHz, providing clean, resonance-free bypass and coupling through Ku, K, and Ka bands. For E-band operation, flip-chip mounting reduces effective ESL below 30pH.
| Parameter | Wedge Bonding | Ball Bonding |
|---|---|---|
| Wire | 25μm Au | 25μm Au |
| Stage Temp | 120-150°C | 150°C |
| Bond Force | 20-30gf | 15-25gf |
| Ultrasonic Power | 60-80mW | 40-60mW |
| Min Pad Opening | 80*80μm | 80*80μm |
| Test | Condition | Duration | Result |
|---|---|---|---|
| HTOL | 125°C, 35V DC bias | 1000hr | <0.5% ΔC |
| HAST | 130°C / 85%RH, 35V | 96hr | No failures |
| Temperature Cycling | -55°C to +125°C | 500 cycles | <0.2% ΔC |
| ESD HBM | 500V | 3 pulses | Class 1B |
| TDDB (projected) | 125°C, 35V | >10 years | <0.1% failure rate |
A certified S-parameter model (100MHz–40GHz, two-port .s2p format) is available under NDA for both wire-bonded and flip-chip mounting configurations. For custom assembly environments, we provide a parameterized 3D EM model (HFSS .aedt or ADS .dsn format) that includes bond wire length, die attach material, and substrate stack-up as user-adjustable parameters. Contact our applications team to request the model library.
Yes. When mounted on a ceramic or organic interposer with appropriate underfill, the device withstands standard lead-free reflow profiles (peak 260°C, >217°C for 60-90 seconds). The 2.5μm Au metallization is stable to >300°C. Note that direct PCB attachment without interposer is not recommended due to CTE mismatch with FR-4.
Standard evaluation kits include 25 dice in waffle pack with a printed test report for the specific wafer lot. Engineering samples ship within 1-2 weeks. No minimum order quantity for initial evaluation — we want to make it easy to prove the performance advantage in your design.
Q factor is tested on a per-wafer sample basis (5 dice per wafer, center and 4 corners) using a calibrated impedance analyzer with Cascade Microtech probes. Full-wafer 100% test covers capacitance, leakage, and breakdown voltage on every die. Statistical process control (SPC) charts for Q are maintained, and any wafer with Q<300 at any sample site is quarantined for engineering review. Typical production Q ranges from 350-420 at 1MHz.
Yes. The HACC series is classified as EAR99 under U.S. Export Administration Regulations. No ITAR restrictions apply. The capacitor is a commercial-off-the-shelf (COTS) component suitable for both commercial and defense applications that do not require ITAR-controlled parts.
Start your evaluation today. Contact us for samples and PDK access.