Nano-Amp 100 pF 10V MOS Capacitors Ultra-Low Leakage Wire Bondable SLC Chip for Battery-Powered IoT Sensors

Key specifications

All values are typical for the standard part and are verified lot by lot. Tightened limits and alternative ratings are available on request.

S-parameter data and free sample programme

Each production lot is supplied with a measured data package so that design models can be validated without a separate measurement cycle:

• Two-port S-parameter files (Touchstone .s2p), DC to 40 GHz, de-embedded to the die pads
• Q factor and ESR versus frequency curves
• Leakage current histogram and capacitance distribution report
• Dielectric withstanding voltage test record and lot traceability sheet
• Free evaluation samples dispatched within 1–2 weeks, including matched pairs for differential or balun structures on request

Compliance, testing and traceability

• RoHS 2015/863 compliant; REACH declaration available; halogen-free per IEC 61249-2-21
• Quality system certified to ISO 9001:2015
• 100% dielectric withstanding voltage screening on every die; electrical parameters sampled per lot
• Electrostatic discharge sensitivity classified per JESD22-A114; ESD-safe packaging supplied as standard
• Each shipment carries a lot number that maps to its test records and S-parameter fil

Typical applications

• Battery-powered IoT sensor nodes and asset tags (LoRa, BLE, UWB, NB-IoT)
• Portable health-monitoring and wearable instruments where sleep current is critical
• Energy-harvesting front-ends and power-management decoupling
• RFID inlays, smart meters and sealed enclosures that cannot be serviced
• Precision integrators, coulomb counters and reference filtering
• DC blocking and impedance matching in compact RF modules